CVE-2023-22347

{"id": "CVE-2023-22347", "metrics": {"cvssMetricV31": [{"type": "Primary", "source": "nvd@nist.gov", "cvssData": {"scope": "UNCHANGED", "version": "3.1", "baseScore": 7.8, "attackVector": "LOCAL", "baseSeverity": "HIGH", "vectorString": "CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H", "integrityImpact": "HIGH", "userInteraction": "REQUIRED", "attackComplexity": "LOW", "availabilityImpact": "HIGH", "privilegesRequired": "NONE", "confidentialityImpact": "HIGH"}, "impactScore": 5.9, "exploitabilityScore": 1.8}]}, "published": "2023-02-13T02:21:06.933", "references": [{"url": "https://jvn.jp/en/vu/JVNVU98917488/", "tags": ["Patch", "Third Party Advisory", "VDB Entry"], "source": "vultures@jpcert.or.jp"}, {"url": "https://www.electronics.jtekt.co.jp/en/topics/202302035233/", "tags": ["Patch", "Vendor Advisory"], "source": "vultures@jpcert.or.jp"}, {"url": "https://www.electronics.jtekt.co.jp/jp/topics/2023020313454/", "tags": ["Patch", "Vendor Advisory"], "source": "vultures@jpcert.or.jp"}], "vulnStatus": "Analyzed", "weaknesses": [{"type": "Primary", "source": "nvd@nist.gov", "description": [{"lang": "en", "value": "CWE-125"}]}], "descriptions": [{"lang": "en", "value": "Out-of-bound read vulnerability exists in Screen Creator Advance 2 Ver.0.1.1.4 Build01 and earlier because the end of data cannot be verified when processing file structure information. Having a user of Screen Creator Advance 2 to open a specially crafted project file may lead to information disclosure and/or arbitrary code execution."}], "lastModified": "2023-02-27T15:08:53.623", "configurations": [{"nodes": [{"negate": false, "cpeMatch": [{"criteria": "cpe:2.3:a:jtekt:screen_creator_advance_2:*:*:*:*:*:*:*:*", "vulnerable": true, "matchCriteriaId": "90B9B99A-ABA6-40C6-8A4E-8422096F0057", "versionEndIncluding": "0.1.1.4"}, {"criteria": "cpe:2.3:a:jtekt:screen_creator_advance_2:0.1.1.4:build01:*:*:*:*:*:*", "vulnerable": true, "matchCriteriaId": "8925669F-2A1C-440A-A685-1438A5C17BDF"}], "operator": "OR"}]}], "sourceIdentifier": "vultures@jpcert.or.jp"}