{"id": "CVE-2018-11982", "metrics": {"cvssMetricV2": [{"type": "Primary", "source": "nvd@nist.gov", "cvssData": {"version": "2.0", "baseScore": 8.3, "accessVector": "ADJACENT_NETWORK", "vectorString": "AV:A/AC:L/Au:N/C:C/I:C/A:C", "authentication": "NONE", "integrityImpact": "COMPLETE", "accessComplexity": "LOW", "availabilityImpact": "COMPLETE", "confidentialityImpact": "COMPLETE"}, "acInsufInfo": false, "impactScore": 10.0, "baseSeverity": "HIGH", "obtainAllPrivilege": false, "exploitabilityScore": 6.5, "obtainUserPrivilege": false, "obtainOtherPrivilege": false, "userInteractionRequired": false}], "cvssMetricV30": [{"type": "Primary", "source": "nvd@nist.gov", "cvssData": {"scope": "UNCHANGED", "version": "3.0", "baseScore": 8.8, "attackVector": "ADJACENT_NETWORK", "baseSeverity": "HIGH", "vectorString": "CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H", "integrityImpact": "HIGH", "userInteraction": "NONE", "attackComplexity": "LOW", "availabilityImpact": "HIGH", "privilegesRequired": "NONE", "confidentialityImpact": "HIGH"}, "impactScore": 5.9, "exploitabilityScore": 2.8}]}, "published": "2018-09-20T13:29:02.057", "references": [{"url": "https://www.qualcomm.com/company/product-security/bulletins", "tags": ["Third Party Advisory"], "source": "product-security@qualcomm.com"}], "vulnStatus": "Analyzed", "weaknesses": [{"type": "Primary", "source": "nvd@nist.gov", "description": [{"lang": "en", "value": "CWE-415"}]}], "descriptions": [{"lang": "en", "value": "In Snapdragon (Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835, Snapdragon_High_Med_2016, a double free of ASN1 heap memory used for EUTRA CAP container occurs during UTRAN to LTE Capability inquiry procedure."}, {"lang": "es", "value": "En Snapdragon (Mobile y Wear) en versiones MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835 y Snapdragon_High_Med_2016, ocurre una doble liberaci\u00f3n (double free) de la memoria din\u00e1mica (heap) de ASN1 empleada para el contenedor EUTRA CAP durante el procedimiento de consulta UTRAN to LTE Capability."}], "lastModified": "2018-11-23T18:07:37.723", "configurations": [{"nodes": [{"negate": false, "cpeMatch": [{"criteria": "cpe:2.3:o:qualcomm:mdm9206_firmware:-:*:*:*:*:*:*:*", "vulnerable": true, "matchCriteriaId": "A960B86A-C397-4ACB-AEE6-55F316D32949"}], "operator": "OR"}, {"negate": false, "cpeMatch": [{"criteria": "cpe:2.3:h:qualcomm:mdm9206:-:*:*:*:*:*:*:*", "vulnerable": false, "matchCriteriaId": "D79B8959-3D1E-4B48-9181-D75FE90AAF98"}], "operator": "OR"}], "operator": "AND"}, {"nodes": [{"negate": false, "cpeMatch": [{"criteria": "cpe:2.3:o:qualcomm:mdm9607_firmware:-:*:*:*:*:*:*:*", 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